Effects of sulfurization on the optical properties of Cu2ZnxFe1-xSnS4 thin films

The Long-Wavelength Edge of Photographic Sensitivity and of the Electronic Absorption of Solids

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Determination of the thickness and optical constants of amorphous silicon

R. Swanepoel · Journal of Physics E Scientific Instruments · 1983 · 3.9K citations

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Device Characteristics of CZTSSe Thin‐Film Solar Cells with 12.6% Efficiency

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Behavior of the Electronic Dielectric Constant in Covalent and Ionic Materials

S. H. Wemple, M. DiDomenico · Physical review. B, Solid state · 1971 · 3K citations

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