Publication | Closed Access
Interfacial characterization in the brazing of silicon nitride to niobium joining using a double interlayer
23
Citations
23
References
2017
Year
Materials EngineeringMaterials ScienceEngineeringSurface ScienceApplied PhysicsInterfacial CharacterizationSiliceneSemiconductor MaterialSemiconductor Device FabricationSilicon On InsulatorMicroelectronicsDouble InterlayerSilicon Nitride
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