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Phase separation-suppressed and strain-modulated improvement of crystalline quality of AlGaN epitaxial layer grown by MOCVD

DOI

14

Citations

36

References

2017

Year

Tien‐Tung Luong, Yen‐Teng Ho, Yuen‐Yee Wong, Shane Chang, Edward Yi Chang
Microelectronics Reliability

References

YearCitations

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