Publication | Closed Access
Studies of the interactions between (311) defects and type I and II dislocation loops in Si+ implanted silicon
39
Citations
9
References
1995
Year
Materials EngineeringEngineeringDislocation InteractionCrystalline DefectsPhysicsApplied PhysicsDefect FormationSemiconductor Device FabricationSilicon On InsulatorMicroelectronicsIi Dislocation LoopsSilicon Debugging
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