Publication | Closed Access
Reliability experiments of sintered silver based interconnections by accelerated isothermal bending tests
35
Citations
46
References
2017
Year
Materials EngineeringMaterials ScienceEngineeringHardware ReliabilityAdvanced Packaging (Semiconductors)Reliability ExperimentsMechanical EngineeringChip AttachmentSolid MechanicsElectronic PackagingMechanics Of MaterialsPhysic Of Failure
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