Publication | Closed Access
Influence of surface relaxation of strained layers on atomic resolution ADF imaging
17
Citations
46
References
2017
Year
Strained LayersEngineeringPhysicsMicroscopyMicroscopy MethodScanning Probe MicroscopySurface ScienceApplied PhysicsElectron MicroscopyAtomic PhysicsMicroanalysisSurface RelaxationSurface Reconstruction
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