Publication | Closed Access
Mechanical Stress in VLSI Interconnections: Origins, Effects, Measurement, and Modeling
52
Citations
13
References
1995
Year
Physical Design (Electronics)EngineeringAdvanced Packaging (Semiconductors)MechanicsStress-induced Leakage CurrentMechanical EngineeringApplied PhysicsStressstrain AnalysisVlsi InterconnectionsSolid MechanicsVlsiElectronic PackagingMicroelectronicsMechanics Of Materials
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