Sub-10-ms X-ray tomography using a grating interferometer

Abstract

An X-ray phase tomogram was successfully obtained with an exposure time of less than 10 ms by X-ray grating interferometry, an X-ray phase imaging technique that enables high-sensitivity X-ray imaging even of materials consisting of light elements. This high-speed X-ray imaging experiment was performed at BL28B2, SPring-8, where a white X-ray beam is available, and the tomogram was reconstructed from projection images recorded at a frame rate of 100,000 fps. The setup of the experiment will make it possible to realize three-dimensional observation of unrepeatable high-speed phenomena with a time resolution of less than 10 ms.