The effects of a multiple carrier model of interface trap generation on lifetime extraction for MOSFETs - Concepedia

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The effects of a multiple carrier model of interface trap generation on lifetime extraction for MOSFETs

21

Citations

0

References

2002

Year

William E. McMahon, Kazunori Matsuda, J. Lee, K. Hess, Joseph W. Lyding

Unknown Venue

Device ModelingMultiple Carrier ModelElectrical EngineeringSemiconductor DeviceEngineeringElectronic EngineeringBias Temperature InstabilityPower ElectronicsLifetime ExtractionMicroelectronicsInterface Trap GenerationCircuit Simulation

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