Publication | Open Access
Dynamic conductance characteristics in HfO<sub>x</sub>-based resistive random access memory
39
Citations
26
References
2017
Year
Dynamic Conductance CharacteristicsNon-volatile MemoryElectrical EngineeringEngineeringElectronic MemoryEmerging Memory TechnologyApplied PhysicsCondensed Matter PhysicsComputer EngineeringReset AnalysisDynamic ConductanceSemiconductor MemoryResistive Random-access MemoryMicroelectronics
Schematic of RESET analysis by dynamic conductance of <italic>I</italic>–<italic>V</italic> curve in HfO<italic>x</italic>-based resistive switching memory.
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