General-Purpose Clocked Gate Driver IC With Programmable 63-Level Drivability to Optimize Overshoot and Energy Loss in Switching by a Simulated Annealing Algorithm

Abstract

A general-purpose clocked gate driver integrated circuit (IC) to generate an arbitrary gate waveform is proposed to provide a universal platform for fine-grained gate waveform optimization handling various power transistors. The fabricated IC with a 0.18 μm Bipolar-CMOS-DMOS process has 63 P-type MOS (PMOS) and 63 N-type MOS (NMOS) driver transistors on a chip whose activation patterns are controlled by 6-bit digital signals and 40 ns time step control. In the 500 V switching measurements with a manual gate waveform optimization, the proposed gate driver reduces the IC overshoot by 25% and 41%, and the energy loss by 38% and 55% for Si-insulated-gate bipolar transistor and SiC-MOSFET, respectively, which demonstrate the feasibility of driving various power devices with the same driver. An automatic optimization by simulated annealing algorithm is introduced to fully utilize the benefit of the gate driver, and the further reduction of IC overshoot by 26% and the energy loss by 18% are achieved over the manual optimization.