In situ analysis of the crystallization process of Sb 2 S 3 thin films by Raman scattering and X-ray diffraction - Concepedia

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In situ analysis of the crystallization process of Sb 2 S 3 thin films by Raman scattering and X-ray diffraction

DOI Full Paper Access

115

Citations

53

References

2017

Year

Romain Parize, Thomas Cossuet, Odette Chaix‐Pluchery, Hervé Roussel, Estelle Appert, Vincent Consonni

Materials & Design

Materials ScienceMaterial AnalysisSitu AnalysisEngineeringX-ray DiffractionApplied PhysicsThin FilmsEpitaxial GrowthCrystallographyThin Film Processing

References

	Year	Citations

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