IEEE Transactions on Circuits and Systems I Regular Papers · 2017 · 44 citations · 22 references
EngineeringComputer EngineeringElectrical EngineeringAnalog ElectronicsInstrumentationReal-time SystemsAnalog Integrated CircuitsCalibrationDigital Signal ProcessingDistortion AnalysisMixed-signal Integrated Circuit DesignMixed-signal IntegrationAnalog-digital ConversionAnalog-to-digital ConversionAnalog-to-digital Converter DesignAnalog-to-digital ConvertersBackground CalibrationCalibration Techniques For Analog CircuitsEngineering SimulationsSignal-to-noise Ratio
This paper presents a digital blind background calibration technique of imperfections in time-interleaved analog-to-digital converters (TI-ADCs). The proposed technique directly operates on the statistics of the input signal to continuously estimate and eliminate the conversion errors resulted from offset, gain, and timing mismatch. Behavioral simulations are presented for a 4-channel 10-bit TI-ADC in order to verify the effectiveness of the proposed method. The signal-to-noise-and-distortion ratio (SNDR) is enhanced from 33.7 dB to more than 61 dB using the introduced calibration technique. This calibration method converges after roughly $4 \times 10^{6}$ conversions.
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