IEEE Journal of Solid-State Circuits · 2002 · 290 citations · 25 references
EngineeringElectrical EngineeringAnalog ElectronicsInstrumentationReal-time SystemsAnalog Integrated CircuitsDigital Integrated CircuitsDigital Signal ProcessingDistortion AnalysisMixed-signal Integrated Circuit DesignSignal ConditioningAdaptive Signal ProcessingAnalog Signal ProcessingAnalog-digital ConversionAnalog-to-digital ConversionAnalog-to-digital ConvertersBackground CalibrationGainOffset Calibration
Digital background calibration in the 10‑bit, 120‑MS/s pipelined ADC uses adaptive signal processing, with a random chopper‑based offset correction and correlation‑based algorithms that null the correlation between a signal and its chopped or delayed image to eliminate offset mismatch, gain mismatch, and sample‑time error across time‑interleaved channels. Test results show that the ADC achieves a peak SNDR of 56.8 dB, INL of 0.88 LSB, and DNL of 0.44 LSB at a 0.99‑MHz sinusoid, a peak SNDR of 50.2 dB at 39.9 MHz, while occupying 5.2 mm² and dissipating 234 mW from a 3.3‑V supply.
Digital calibration using adaptive signal processing corrects for offset mismatch, gain mismatch, and sample-time error between time-interleaved channels in a 10-b 120-Msample/s pipelined analog-to-digital converter (ADC). Offset mismatch between channels is overcome with a random chopper-based offset calibration. Gain mismatch and sample-time error are overcome with correlation-based algorithms, which drive the correlation between a signal and its chopped image or its chopped and delayed image to zero. Test results show that, with a 0.99-MHz sinusoidal input, the ADC achieves a peak signal-to-noise-and-distortion ratio (SNDR) of 56.8 dB, a peak integral nonlinearity of 0.88 least significant bit (LSB), and a peak differential nonlinearity of 0.44 LSB. For a 39.9-MHz sinusoidal input, the ADC achieves a peak SNDR of 50.2 dB. The active area is 5.2 mm/sup 2/, and the power dissipation is 234 mW from a 3.3-V supply.
25
Signal Processing · 1986 · 1.6K citations
Splitting the unit delay [FIR/all pass filters design]
T.I. Laakso, Vesa Välimäki, Matti Karjalainen et al. · IEEE Signal Processing Magazine · 1996 · 1.1K citations
Time interleaved converter arrays
W.C. Black, D.A. Hodges · IEEE Journal of Solid-State Circuits · 1980 · 822 citations
Engineering, Computer Engineering, Electrical Engineering +16