Publication | Open Access
Multislice does it all—calculating the performance of nanofocusing X-ray optics
54
Citations
32
References
2017
Year
X-ray SpectroscopyEngineeringMicroscopyIncidence ReflectivityX-ray FluorescenceX-ray ImagingOptical PropertiesX-ray TechnologyComputational ImagingOptical SystemsNanophotonicsRadiologyHealth SciencesPhotonicsPhysicsX-ray OpticsMultislice PropagationSynchrotron RadiationX-ray Free-electron LaserX-ray DiffractionApplied PhysicsOptical SciencesX-ray Optic
We describe an approach to calculating the optical performance of a wide range of nanofocusing X-ray optics using multislice scalar wave propagation with a complex X-ray refractive index. This approach produces results indistinguishable from methods such as coupled wave theory, and it allows one to reproduce other X-ray optical phenomena such as grazing incidence reflectivity where the direction of energy flow is changed significantly. Just as finite element analysis methods allow engineers to compute the thermal and mechanical responses of arbitrary structures too complex to model by analytical approaches, multislice propagation can be used to understand the properties of the real-world optics of finite extent and with local imperfections, allowing one to better understand the limits to nanoscale X-ray imaging.
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