Publication | Closed Access
High bandwidth memory(HBM) with TSV technique
59
Citations
3
References
2016
Year
Unknown Venue
Hardware SecurityTsv TechniqueElectrical EngineeringReliability EngineeringEngineeringHardware ReliabilityRepresentative Dram ProductHigh Bandwidth MemoryMem TestingHbm DramIn-memory DatabaseComputer ArchitectureComputer EngineeringMemory DeviceMicroelectronicsMemory Architecture
In this paper, HBM DRAM with TSV technique is introduced. This paper covers the general TSV feature and techniques such as TSV architecture, TSV reliability, TSV open / short test, and TSV repair. And HBM DRAM, representative DRAM product using TSV, is widely presented, especially the use and features.
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