MicroStamping for Improved Speckle Patterns to Enable Digital Image Correlation

Abstract

Journal Article MicroStamping for Improved Speckle Patterns to Enable Digital Image Correlation Get access Andrew H Cannon, Andrew H Cannon 1900 Engineering, LLC, Clemson, SC, USA Search for other works by this author on: Oxford Academic Google Scholar Jacob D Hochhalter, Jacob D Hochhalter NASA Langley, Durability, Damage Tolerance, and Reliability Branch, Hampton, VA, USA Search for other works by this author on: Oxford Academic Google Scholar Alberto W Mello, Alberto W Mello Purdue University, School of Aeronautics and Astronautics, West Lafayette, IN, USA Search for other works by this author on: Oxford Academic Google Scholar Geoffrey F Bomarito, Geoffrey F Bomarito NASA Langley, Durability, Damage Tolerance, and Reliability Branch, Hampton, VA, USA Search for other works by this author on: Oxford Academic Google Scholar Michael D Sangid Michael D Sangid Purdue University, School of Aeronautics and Astronautics, West Lafayette, IN, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 21, Issue S3, 1 August 2015, Pages 451–452, https://doi.org/10.1017/S1431927615003050 Published: 23 September 2015