Publication | Closed Access
Interface Engineering for Precise Threshold Voltage Control in Multilayer‐Channel Thin Film Transistors
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Citations
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References
2016
Year
EngineeringThin Film Process TechnologySemiconductor DeviceNanoelectronicsZinc Oxide TransistorsThin Film ProcessingThin-film TechnologyDevice ModelingElectrical EngineeringMultilayer Channel StructureNanotechnologyOxide ElectronicsInterface EngineeringIntrinsic ImpurityGallium OxideMicroelectronicsMultilayer ChannelApplied PhysicsThin Film DevicesThin Films
Multilayer channel structure is used to effectively manipulate the threshold voltage of zinc oxide transistors without degrading its field-effect mobility. Transistors operating in enhancement mode with good mobility are fabricated by optimizing the structure of the multilayer channel. The optimization is attributed to the formation of additional channel and suppression of the diffusion of absorbed water molecules and oxygen vacancies. As a service to our authors and readers, this journal provides supporting information supplied by the authors. Such materials are peer reviewed and may be re-organized for online delivery, but are not copy-edited or typeset. Technical support issues arising from supporting information (other than missing files) should be addressed to the authors. Please note: The publisher is not responsible for the content or functionality of any supporting information supplied by the authors. Any queries (other than missing content) should be directed to the corresponding author for the article.
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