Spectroscopic imaging ellipsometry for automated search of flakes of mono- and n-layers of 2D-materials - Concepedia

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Spectroscopic imaging ellipsometry for automated search of flakes of mono- and n-layers of 2D-materials

35

Citations

16

References

2016

Year

Sebastian Funke, Ursula Wurstbauer, Bastian Miller, Aleksandar Matković, A. Green, Alain C. Diebold, Christian Röling, Peter Thiesen

Applied Surface Science

Materials ScienceOptical MaterialsEngineeringMicroscopyOptical PropertiesSpectroscopyImaging SpectroscopyApplied PhysicsMicroanalysisAutomated SearchOptical SpectroscopySpectroscopic PropertySpectroscopic Method

References

	Year	Citations

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