2010 · 26 citations · 6 references
EngineeringElectrical EngineeringPhysicsCircuit TheoryMicroelectronicsMicrowave EngineeringAcoustic Wave PropagationDistortion AnalysisMicrowave Device SimulationMicrowave Semiconductor DevicesNonlinear Circuit AnalysisAcoustic Wave DistortionHarmonic DistortionHarmonicsIntermodulation DistortionNonlinear Device CharacterizationNonlinear DistortionNonlinear Distortion AnalysisThird-order Distortion
Nonlinearity distortion characterization and accurate modeling techniques for leaky surface acoustic wave (LSAW) devices have been desired in the recently years due to the applications of the Radio Frequency (RF) SAW duplexers in the third-generation (3G) telecommunication system, such as Universal Mobile Telecommunications System (UMTS). In the work, we first discuss the approaches to measure and characterize the 3<sup>rd</sup> order harmonic generation of the resonators on lithium tantalate YXl42° wafer and YXl48° wafer, with resonance frequency of 800MHz to 900 MHz; Second, we present an effective nonlinear Butterworth-van-Dyke (BVD) model to simulate the multi-tone 3<sup>rd</sup> order intermodulation effects of a band 5 duplexer; simulation result vs. measurement of 3<sup>rd</sup> order harmonic generation, 3<sup>rd</sup> order intermodulation (IMD3) and triple beat are presented.
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