Concepedia

Quantitative EDXS: Influence of geometry on a four detector system

Johanna Kraxner, Margit Schäfer, Otto Röschel, Gerald Kothleitner, Georg Haberfehlner, Manuel Paller, Werner Grogger

Ultramicroscopy · 2016 · 23 citations · 21 references

DOI

Concepts

References

21

The quantitative analysis of thin specimens

G. Cliff, G. W. Lorimer · Journal of Microscopy · 1975 · 1.8K citations

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Theoretical Form Factor, Attenuation, and Scattering Tabulation for <i>Z</i>=1–92 from <i>E</i>=1–10 eV to <i>E</i>=0.4–1.0 MeV

Christopher T. Chantler · Journal of Physical and Chemical Reference Data · 1995 · 676 citations · Full text

, , +9

Silicon drift detectors for high resolution room temperature X-ray spectroscopy

P. Lechner, S. Eckbauer, Robert Hartmann et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 1996 · 324 citations

, , +12

Spectroscopic electron tomography

Günter Möbus, R. C. Doole, Beverley J. Inkson · Ultramicroscopy · 2003 · 175 citations

STEM-EDX tomography of bimetallic nanoparticles: A methodological investigation

Thomas J. A. Slater, Pedro H. C. Camargo, M.G. Burke et al. · Ultramicroscopy · 2015 · 92 citations · Full text

, , +17