1989 · 20 citations · 5 references
EngineeringElectrical EngineeringInstrumentationMicroelectronicsMicrowave EngineeringMicrowave Integrated CircuitsMicrowave MeasurementsMicrowave Semiconductor DevicesNoiseNoise MeasurementNoise TestingMicrowave Noise CharacterizationNoise CharacterizationNoise FigureNoise Figure MeasurementNoise Parameter ExtractionNoise ParametersOn-wafer MeasurementOn-wafer Measurement Techniques
A new 2-26.5 GHz on wafer noise parameter measurement is presented. A solid state impedance tuner based test set in conjunction with a vector network analyzer (NWA) and a noise figure system (NFS) can determine the noise and S-parameters of the devices.
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