Close packed prism arrays for electron microscopy

Abstract

The concept of «close packed» magnetic prism arrays for the manipulation of beams in an electron microscope is discussed. These arrays act as 0 o or 90 o elements, allowing side mounted electron guns, energy guns, energy analyzers, correctors etc. to be used in conjunction with axially symmetric lens optics. We emphasize applications in low energy, surface imaging reflection microscopy (LEEM), and in spectroscopic TEM/LEEM, showing how this technology may be integrated into a TEM. These compact, mechanically accurate arrays may be designed to act almost like axially symmetric lenses. They require no additional unfamiliar elements to provide stigmatic, distortion free transfer of image and diffraction planes to arbitrary conjugate planes outside the prism array