Characterization of the structure of low-e substrates and consequences for IR transflection measurements - Concepedia

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Characterization of the structure of low-e substrates and consequences for IR transflection measurements

22

Citations

20

References

2016

Year

Brent M. DeVetter, Seth Kenkel, Shachi Mittal, Rohit Bhargava, Tomasz P. Wróbel

Vibrational Spectroscopy

Low-e SubstratesEngineeringPhysicsInfrared SensorOptical PropertiesSpectroscopyIr Transflection MeasurementsApplied PhysicsNatural SciencesInfrared SpectroscopyAtomic PhysicsInfrared OpticNear-infrared SpectroscopyOptoelectronicsSpectroscopic Property

References

	Year	Citations

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