Mechanisms of deformation-induced trace element migration in zircon resolved by atom probe and correlative microscopy - Concepedia

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Mechanisms of deformation-induced trace element migration in zircon resolved by atom probe and correlative microscopy

86

Citations

99

References

2016

Year

Steven M. Reddy, Arie van Riessen, David W. Saxey, Tim Johnson, William D.A. Rickard, Denis Fougerouse, Sebastian Fischer, Ty J. Prosa, Katherine P. Rice, D. Reinhard,

Geochimica et Cosmochimica Acta

Materials ScienceEngineeringElectron MicroscopyPhysicsMicroscopyScanning Probe MicroscopyApplied PhysicsAtomic PhysicsMicroanalysisAtom ProbeCorrelative Microscopy

References

	Year	Citations

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