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Infrared-spectroscopic single-shot laser mapping ellipsometry: Proof of concept for fast investigations of structured surfaces and interactions in organic thin films

EngineeringLaser PhotochemistryOrganic ElectronicsOptical PropertiesSpectroscopyNatural SciencesApplied PhysicsOrganic SemiconductorStructured SurfacesChemistryOrganic Thin FilmsOptical SpectroscopyLaser-surface InteractionsFast InvestigationsSpectroscopic Property