Fixturing impacts on high‐frequency low‐resistance, low‐inductance impedance measurements

Abstract

Multiple off‐the‐shelf test‐fixtures are available to interface a device‐under‐test (DUT) to an impedance analyser to characterise its electrical properties. The impact of three available fixtures on the measured impedance of a low‐resistance, low‐inductance DUT requiring high‐frequency (≥100 MHz) characterisation are compared with a custom fixture. The custom fixture is shown to provide a higher accuracy than the off‐the‐shelf fixtures, highlighting that low‐resistance, low‐inductance devices require carefully constructed fixtures for characterisation. The experimental results collected using the fixtures are validated against a finite‐element‐analysis model of the DUT.