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The use of diffraction-based time-of-flight measurements to locate and size defects
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1984
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Size DefectsDiffraction-based Time-of-flight MeasurementsEngineeringPhysicsMeasurementCalibrationLength MetrologyMicroscopyApplied PhysicsDiffractionNondestructive TestingEducationTime MetrologyInstrumentationTime-of-flight ImagingDiffractive Optic
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