Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy

Norbert Schäfer, A.J. Wilkinson, Thomas Schmid, Aimo Winkelmann, Gilbert Chahine, Tobias U. Schülli, T. Rissom, Julien Marquardt, Susan Schorr, Daniel Abou‐Ras

Ultramicroscopy · 2016 · 12 citations · 37 references

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