Seeing Down to the Bottom: Nondestructive Inspection of All‐Polymer Solar Cells by Kelvin Probe Force Microscopy

Abstract

The material composition in a bulk heterojunction (BHJ) of an all-polymer solar cell is analyzed down to the bottom surface by Kelvin probe force microscopy. The phase separation of the composites both on the top and at the bottom of a BHJ can be measured and reconstructed with this easy-to-use approach in a nondestructive way. As a service to our authors and readers, this journal provides supporting information supplied by the authors. Such materials are peer reviewed and may be re-organized for online delivery, but are not copy-edited or typeset. Technical support issues arising from supporting information (other than missing files) should be addressed to the authors. Please note: The publisher is not responsible for the content or functionality of any supporting information supplied by the authors. Any queries (other than missing content) should be directed to the corresponding author for the article.