Prediction of Induced Voltages on Ports in Complex, Three-Dimensional Enclosures With Apertures, Using the Random Coupling Model

Abstract

A statistical modeling technique known as the random coupling model (RCM) is an effective method for estimating the probabilistic magnitudes of induced voltages on objects within a closed, complex, three-dimensional (3-D) enclosure. The limitations of the RCM to predict electromagnetic wave coupling into an enclosure with apertures are examined. We experimentally demonstrate the applicability of the RCM to estimate the probabilistic magnitudes of voltages induced on ports in a complex 3-D enclosure with an electrically large aperture. This study is a first step toward being able to predict effects on sensitive electronic targets in large, real-world, lossy enclosures such as office buildings, ship compartments, and aircraft compartments.