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Identification of microplastics by FTIR and Raman microscopy: a novel silicon filter substrate opens the important spectral range below 1300 cm−1 for FTIR transmission measurements

MicroplasticsChemical EngineeringRaman MicroscopyEngineeringFtir Transmission MeasurementsMicroscopyOptical PropertiesSpectroscopyMaterials CharacterizationSurface-enhanced Raman ScatteringImportant Spectral RangeNanoplasticsOptical CharacterizationOptical SensorsSpectroscopic Method