Publication | Closed Access
Two-dimensional lateral heterojunction through bandgap engineering of MoS<sub>2</sub>via oxygen plasma
74
Citations
33
References
2016
Year
Wide-bandgap SemiconductorOptical MaterialsMolybdenum DisulfideEngineeringOptoelectronic DevicesSemiconductor NanostructuresSemiconductorsQuantum MaterialsBandgap EngineeringOxide HeterostructuresMaterials ScienceSemiconductor TechnologyPhotoluminescencePhysicsCrystalline DefectsOxygen PlasmaOxide ElectronicsOxide SemiconductorsCondensed Matter PhysicsApplied PhysicsMultilayer HeterostructuresPlasma TreatmentOptoelectronics
The present study explores the structural, optical (photoluminescence (PL)), and electrical properties of lateral heterojunctions fabricated by selective exposure of mechanically exfoliated few layer two-dimensional (2D) molybdenum disulfide (MoS2) flakes under oxygen (O2)-plasma. Raman spectra of the plasma exposed MoS2 flakes show a significant loss in the structural quality due to lattice distortion and creation of oxygen-containing domains in comparison to the pristine part of the same flake. The PL mapping evidences the complete quenching of peak A and B consistent with a change in the exciton states of MoS2 after the plasma treatment, indicating a significant change in its band gap properties. The electrical transport measurements performed across the pristine and the plasma-exposed MoS2 flake exhibit a gate tunable current rectification behavior with a rectification ratio up to 1.3 × 10(3) due to the band-offset at the pristine and plasma-exposed MoS2 interface. Our Raman, PL, and electrical transport data confirm the formation of an excellent lateral heterojunction in 2D MoS2 through its bandgap modulation via oxygen plasma.
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