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Modeling and analysis of crosstalk induced overshoot/undershoot effects in multilayer graphene nanoribbon interconnects and its impact on gate oxide reliability

Graphene NanomeshesElectrical EngineeringGate Oxide ReliabilityEngineeringNanoelectronicsBias Temperature InstabilityApplied PhysicsOvershoot/undershoot EffectsGrapheneGraphene NanoribbonElectronic PackagingMicroelectronics