Publication | Closed Access
High-Speed Scanning Electrochemical Microscopy Method for Substrate Kinetic Determination: Method and Theory
34
Citations
22
References
2015
Year
EngineeringMicroscopyBiomedical EngineeringElectrochemical MicroscopyKinetic RateChemical EngineeringMicroscopy MethodAnalytical ChemistrySubstrate Kinetic DeterminationLight MicroscopyMicrofluidicsElectrode Reaction MechanismBiophysicsImagingElectrochemical CellElectrochemistryMicroscope Image ProcessingScanning Probe MicroscopyBioelectronicsBiomedical ImagingFundamental ElectrochemistryScanning Force MicroscopyNonlinear Fit StrategyElectroanalytical SensorMedicine
Scanning electrochemical microscopy (SECM) allows imaging and analysis of a variety of biological samples, such as living cells. Up to now, it still remains a challenge to successfully decouple signals related to topography and reactivity. Furthermore, such delicate samples require careful adjustment of experimental parameters, such as scan velocity. The present study proposes a method to extract a substrate's kinetic rate by numerical modeling and experimental high speed constant height SECM imaging. This is especially useful for the determination of substrates with unknown surface reaction kinetics and large topographical features. To make this approach applicable to soft cell samples, which cannot be imaged at high velocity, a nonlinear fit strategy is presented to obtain kinetic rate values also under slow scan velocity conditions.
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