Integrated wideband reflectometer with on-line reference measurement capability

Abstract

The aim of the paper is to show the novel integrated reflectometer designed for the wideband sensing in the arbitrary frequency band up to 9 GHz and beginning at the DC. The reflectometer utilizes pseudo noise (PN) based single chip transceiver with one transmitter and two wideband sub-sampling receivers including integrated directional couplers. The topology with the two monolithically realized receive channels allows on-line monitoring of the difference between the reference, i.e. well-known medium, and the medium under test (MUT). Simple experiment with moist and dry grain shows the early competence of the approach for the process or material monitoring purposes.