Thickness identification of epitaxial Bi₂Te₃via optical contrast

Abstract

Two-dimensional (2D) nanosheet thickness identification is effective for rapidly determining thickness-dependent properties of 2D materials. Bismuth telluride (Bi2Te3) is a 2D material known for its promising thermoelectric properties and potential dissipationless charge transport in the topological surface states. To date, thickness measurements of Bi2Te3 2D nanosheets are mainly carried out via atomic force microscope or Raman spectroscopy. Here, we investigate a practical, rapid, inexpensive, and non-invasive thickness measurement technique that utilizes the optical contrast of Bi2Te3 2D nanosheets on a mica substrate (i.e., as-grown) and a SiO2/Si substrate (i.e., transferred). The reflected optical intensity and the corresponding contrast are studied as a function of Bi2Te3 thickness, illumination wavelength, and substrate thickness. Disagreement between experimental and calculated optical contrast values is observed, which is ascribed to the thickness-dependent refractive indices of Bi2Te3, mica thickness error, and the deviation from normal light incidence. Despite thin film interference in mica, the monotonic relationship between nanosheet's contrast and thickness makes mica a better substrate for identifying Bi2Te3 thickness. In addition, a brief recipe is provided for such a thickness identification method to be generally applied in any laboratory.