A comparison of 4 MeV Proton and Co-60 gamma irradiation induced degradation in the electrical characteristics of N-channel MOSFETs - Concepedia

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A comparison of 4 MeV Proton and Co-60 gamma irradiation induced degradation in the electrical characteristics of N-channel MOSFETs

15

Citations

27

References

2016

Year

Arshiya Anjum, Vinayakprasanna N. Hegde, T. M. Pradeep, N. Pushpa, J.B.M. Krishna, A. P. Gnana Prakash

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms

Electrical EngineeringEngineeringBias Temperature InstabilitySingle Event EffectsCo-60 Gamma IrradiationN-channel MosfetsRadiation ApplicationMev ProtonMicroelectronics

References

	Year	Citations

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