Journal of Computational Electronics · 2016 · 26 citations · 11 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsMicroelectronicsSemiconductor DevicesCurrent-voltage CharacteristicsDevice CharacterizationDevice ModelingField-effect TransistorsIntegrated Circuit DesignNanoelectronicsAnalytical Performance ModelingField-effect Transistor SimulationField-effect Transistor Transfer CharacteristicsGate-dependent Current-voltage BehaviorMetal-oxide-semiconductor Field-effect Transistor ModelingThreshold VoltageThreshold Voltage ExtractionThreshold Voltage Modeling
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Quantum-mechanical effects on the threshold voltage of ultrathin-SOI nMOSFETs
Yasuhisa Ōmura, S. Horiguchi, M. Tabe et al. · IEEE Electron Device Letters · 1993 · 275 citations