Publication | Closed Access
Analytical modeling of threshold voltage for symmetrical silicon nano-tube field-effect-transistors (Si-NT FETs)
26
Citations
11
References
2016
Year
Device ModelingElectrical EngineeringEngineeringNanoelectronicsBias Temperature InstabilityApplied PhysicsThreshold VoltageAnalytical ModelingSi-nt FetsMicroelectronicsSemiconductor Device
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