Publication | Closed Access
A concise study of neutron irradiation effects on power MOSFETs and IGBTs
14
Citations
15
References
2016
Year
Electrical EngineeringEngineeringNeutron Irradiation EffectsBias Temperature InstabilityConcise StudyApplied PhysicsNeutron SourcePower Semiconductor DevicePower ElectronicsPower MosfetsNeutron ScatteringNuclear Engineering
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