Refinement of the Structure of MnSi by Powder Diffraction

Abstract

Abstract Crystal data and results of structure refinements for MnSi are reported. The material is cubic, P2 1 3, with a = 4.5603(2) Å, V d = 94.84(1) Å 3 , Z = 4, D x = 5.815 Mg/m 3 . Intensity data were obtained from a Stoe transmission type diffractometer equipped with a position sensitive detector. CuKα 1 radiation, λ = 1.5405981 Å was employed. Germanium was used as an internal standard for the determination of the lattice constant (a Ge = 5.6582 Å). The structure was refined by the Rietveld method by aid of three different programs.