IEEE Journal of the Electron Devices Society · 2016 · 39 citations · 12 references
EngineeringElectrical EngineeringRadiation DetectionRadiation MeasurementSensorsDetector TechnologyImage SensorsNoiseNoise In Electronic DevicesNoise MeasurementSensor NoiseConversion GainDetector Noise CharacterizationGainImage Sensor TechnologyPhoton CountingRead NoiseReadout NoiseSensor Gain
A new method for characterizing deep sub-electron read noise image sensors is reported. This method, based on the photon-counting histogram, can provide easy, independent and simultaneous measurements of the quanta exposure, conversion gain, and read noise. This new method provides a more accurate measure of conversion gain and read noise over conventional characterization techniques for image sensors with read noise from 0.15-0.40e- rms.
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