“H-Bar Lift-Out” and “Plan-View Lift-Out”: Robust, Re-thinnable FIB-TEM Preparation for Ex-Situ Cross-Sectional and Plan-View FIB Specimen Preparation

Abstract

Journal Article "H-Bar Lift-Out" and "Plan-View Lift-Out": Robust, Re-thinnable FIB-TEM Preparation for Ex-Situ Cross-Sectional and Plan-View FIB Specimen Preparation Get access R J Patterson, R J Patterson Fibics Incorporated, 556 Booth St. Ottawa, Ontario, Canada K1A 0G1 ([e-mail]) Search for other works by this author on: Oxford Academic Google Scholar D Mayer, D Mayer Fibics Incorporated, 556 Booth St. Ottawa, Ontario, Canada K1A 0G1 ([e-mail]) Search for other works by this author on: Oxford Academic Google Scholar L Weaver, L Weaver Fibics Incorporated, 556 Booth St. Ottawa, Ontario, Canada K1A 0G1 ([e-mail]) Search for other works by this author on: Oxford Academic Google Scholar MW Phaneuf MW Phaneuf Fibics Incorporated, 556 Booth St. Ottawa, Ontario, Canada K1A 0G1 ([e-mail]) Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 8, Issue S02, 1 August 2002, Pages 566–567, https://doi.org/10.1017/S1431927602105502 Published: 01 August 2002