X‐ray diffraction analysis on layers in graphene samples obtained by electrolysis in molten salts: a new perspective

Abstract

There are several accepted methods used for X‐ray diffraction analysis on graphene layers and sample's stacking height L C . The Scherrer equation is avoided since the layers in the graphene samples are non‐uniformly distributed and therefore the samples have non‐uniform thickness. Instead, a model that includes thickness distribution is used to calculate the average number of layers and then the stacking height. The analysis was performed on 12 graphene samples produced by high‐temperature electrolysis in molten salts. Another method that was used to calculate the number of layers and hence the samples’ stacking height, was Raman spectra C ‐peak position method. It served as a control model for the analysed samples, since for four samples the corresponding parts of the Raman spectra were not usable due to the very low‐frequency region. However, the obtained results of both methods were in agreement, and indicate that studied graphene samples are few layered.