Publication | Closed Access
Electron spectrometry at the µeV level and the electron affinities of Si and F
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References
2001
Year
EngineeringMicroscopyContrast Reduction FactorChemistryMicroscopy MethodElectron SpectroscopyLight MicroscopyIon EmissionBiophysicsRadiologyPhysicsOphthalmologyElectron SpectrometryOptical ImagingElectron AffinitiesSpectroscopyApplied PhysicsBiomedical ImagingµEv LevelOptical Coherence TomographyFirst WayMedicineSection 3
In section 3, the effect of Doppler broadening on photodetachment microscopy interference patterns is calculated in two ways. The first way is to calculate the effect of spectral broadening directly and that yields a contrast reduction factor
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