Journal of Alloys and Compounds · 2016 · 122 citations · 53 references
Materials ScienceElectrical EngineeringEngineeringOptoelectronic PropertiesOxide ElectronicsApplied PhysicsSemiconductor MaterialOptical CeramicThin FilmsOptoelectronicsThin Film ProcessingLanthanum Doping
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The Scherrer Formula for X-Ray Particle Size Determination
A. L. Patterson · Physical Review · 1939 · 8.7K citations