Temperature dependent electrical characterization of thin film Cu₂ZnSnSe₄solar cells

Abstract

Impedance spectroscopy (IS) and current–voltage characteristics measurements were applied to study properties of a Cu 2 ZnSnSe 4 (CZTSe) thin film solar cell. IS measurements were done in the frequency range 20 Hz to 10 MHz. The measurement temperature was varied from 10 K to 325 K with a step ▵ T = 5 K. Temperature dependence of V oc revealed an activation energy of 962 meV, which is in the vicinity of the band gap energy of CZTSe and hence the dominating recombination mechanism in this solar cell is bulk recombination. Different temperature ranges, where electrical properties change, were found. Interface states at grain boundaries with different properties were revealed to play an important role in impedance measurements. These states can be described by introducing a constant phase element in the equivalent circuit.