Automated High Precision Strain Measurement Using Nanobeam Diffraction Coupled with Precession

Amith Darbal, Raghuram Narayan, C. B. Vartuli, G. D. Lian, Ray Graham, F. Shaapur, Stavros Nicolopoulos, J. K. Weiss

Microscopy and Microanalysis · 2013 · 10 citations · 0 references

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.