Using technical noise to increase the signal-to-noise ratio of measurements via imaginary weak values

Abstract

The advantages of weak measurements, and especially measurements of imaginary weak values, for precision enhancement, are discussed. A situation is considered in which the initial state of the measurement device varies randomly on each run, and is shown to be in fact beneficial when imaginary weak values are used. The result is supported by numerical calculation and also provides an explanation for the reduction of technical noise in some recent experimental results. A connection to quantum metrology formalism is made.