ACS Applied Materials & Interfaces · 2015 · 22 citations · 35 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsCurrent-voltage CharacteristicsDevice ModelingMemory DevicesMemristive MaterialsSemiconductor Device MaterialsSemiconductor PhysicsDirect TunnelingFerroelectric Memristive MaterialsFerroelectric Tunnel JunctionsMemristive MemoryNonlinearityResistive SwitchingThermionic EmissionTunneling Current
Cross-point array (CPA) structure memories using a memristor are attracting a great deal of attention due to their high density integration with a 4F2 cell. However, a common significant drawback of the CPA configuration is crosstalk between cells. To date, the CPA structure using a redox-based memristor has restrictions to minimize the operating current level due to their resistive switching mechanism. This study demonstrates suitable characteristics of a ferroelectric tunnel junction (FTJ) for the memristor of the CPA structure using an electrostatic model. From the FTJ of the Au/p-type Pr0.98Ca0.02MnO3 (4 nm)/BaTiO3 (4.3 nm)/n-type Ca0.98Pr0.02MnO3 (3 nm)/Pt(111) structure, which has a higher and thicker potential barrier, a good memristive effect for the CPA structure with a high nonlinear current-voltage curve and low current operation, was obtained by Δ Fowler-Nordheim tunneling with effectively blocked direct tunneling and thermionic emission. The FTJ demonstrated reduced sneak current and the possible for high nonlinearity.
35
Memristive switching mechanism for metal/oxide/metal nanodevices
J. Joshua Yang, Matthew D. Pickett, Xuema Li et al. · Nature Nanotechnology · 2008 · 3K citations
The physics of manganites: Structure and transport
M. B. Salamon, M. Jaime · Reviews of Modern Physics · 2001 · 2.5K citations